Tham khảo tài liệu 'nanomaterials for nanoscience and nanotechnology part 2', kỹ thuật - công nghệ, cơ khí - chế tạo máy phục vụ nhu cầu học tập, nghiên cứu và làm việc hiệu quả | Characterization of Nanophase- Materials. Edited by Zhong Lin Wang Copyright 2000 Wiley-VCH Verlag GmbH ISBNs 3-527-29837-1 Hardcover 3-527-60009-4 Electronic 2 X-ray Characterization of Nanoparticles Daniela Zanchet Blair D. Hall and Daniel Ugarte Introduction The hunt for new applications of nanostructured systems is now a major area of research in materials science and technology. To exploit the full potential that nanosystems offer it is important that novel methods of manipulation and fabrication he developed in addition to extending current techniques of sample characterization to smaller sizes. Success in devising and assembling systems on the scale of nanometers will require a deeper understanding of the basic processes and phenomena involved. Hence one of the current key objectives is to adapt and develop a range of techniques that can characterize the structural electronic magnetic and optical properties of nanostructured systems. High-resolution techniques that provide local information on the nanometer scale such as electron or scanning probe microscopies as well as those that provide only ensemble-average measurements are all important in obtaining a complete picture of material properties. One of the most fundamental characteristics of nanometer-sized particles is their very high surface-to-volume ratio. This can lead to novel and unexpected atomic arrangements and may also have dramatic effects on other physical or chemical attributes. Because of this the precise determination of n anoparti d c struct Lire both medium-range order and or the existence of local distortion is a fundamental Methods of structure determination can be broadly classified in two categories depending on the use of real or reciprocal space data. Direct space methods allow the visualization of the atomic arrangement in nanometer-sized regions the most vivid examples are High Resolution Transmission Electron Microscopy HRTEM and Scanning Probe Microscopies Scanning Tunneling
