Tuyển tập báo cáo các nghiên cứu khoa học quốc tế ngành hóa học dành cho các bạn yêu hóa học tham khảo đề tài: Atomic force microscopy analysis of nanoparticles in non-ideal conditions | Klapetek et al. Nanoscale Research Letters 2011 6 514 http content 6 1 514 o Nanoscale Research Letters a SpringerOpen Journal NANO EXPRESS Open Access Atomic force microscopy analysis of nanoparticles in non-ideal conditions Pcutr ilrr id Calvk3 Pữtr iO ziL 3 retr Klapetek Miroslav valtr David Necas Ota Salyk and retr Dzik Abstract Nanoparticles are often measured using atomic force microscopy or other scanning probe microscopy methods. For isolated nanoparticles on flat substrates this is a relatively easy task. However in real situations we often need to analyze nanoparticles on rough substrates or nanoparticles that are not isolated. In this article we present a simple model for realistic simulations of nanoparticle deposition and we employ this model for modeling nanoparticles on rough substrates. Different modeling conditions coverage relaxation after deposition and convolution with different tip shapes are used to obtain a wide spectrum of virtual AFM nanoparticle images similar to those known from practice. Statistical parameters of nanoparticles are then analyzed using different data processing algorithms in order to show their systematic errors and to estimate uncertainties for atomic force microscopy analysis of nanoparticles under non-ideal conditions. It is shown that the elimination of user influence on the data processing algorithm is a key step for obtaining accurate results while analyzing nanoparticles measured in non-ideal conditions. Introduction Nanoparticle analysis is an important challenge in the present nanoscale metrology. Nanoparticles are used in many fields of research and technology 1-5 and their proper characterization is therefore very important. Even if there are several general and well established experimental methods to nanoparticle analysis optical methods 6-8 electrochemistry-based methods 9 electron microscopy 10 11 X-ray methods 10 12 and scanning probe microscopy 10 13 their results differ mutually .
