Tuyển tập báo cáo các nghiên cứu khoa học quốc tế ngành hóa học dành cho các bạn yêu hóa học tham khảo đề tài: Atomic Force Microscopy Study of the Kinetic Roughening in Nanostructured Gold Films on SiO2 | Nanoscale Res Lett 2009 4 262-268 DOI S11671-008-9235-0 NANO EXPRESS Atomic Force Microscopy Study of the Kinetic Roughening in Nanostructured Gold Films on SiO2 F. Ruffino M. G. Grimaldi F. Giannazzo F. Roccaforte V. Raineri Received 17 November 2008 Accepted 18 December 2008 Published online 6 January 2009 to the authors 2009 Abstract Dynamic scaling behavior has been observed during the room-temperature growth of sputtered Au films on SiO2 using the atomic force microscopy technique. By the analyses of the dependence of the roughness r of the surface roughness power P f and of the correlation length n on the film thickness h the roughness exponent a the growth exponent b and the dynamic scaling exponent z were independently obtained. These values suggest that the sputtering deposition of Au on SiO2 at room temperature belongs to a conservative growth process in which the Au grain boundary diffusion plays a dominant role. Keywords Dynamic scaling behavior Kinetic roughening Atomic force microscopy Gold SiO2 Introduction Thin films having nm thickness play important roles in various fields of modern day science and technology 1 2 . In particular the structure and properties of metal films on non-metal surfaces are of considerable interest 3-6 due to their potential applications in various electronic magnetic and optical devices. Most of these properties change F. Ruffino H M. G. Grimaldi Dipartimento di Fisica e Astronomia MATIS CNR-INFM Universita di Catania via S. Sofia 64 I-95123 Catania Italy e-mail F. Giannazzo F. Roccaforte V. Raineri Consiglio Nazionale delle Ricerche-Istituto per la Microelettronica e Microsistemi VIII Strada 5 I-95121 Catania Italy drastically when ultrathin films are formed from bulk materials because of the confinement effects. The study of the morphology of thin films with the variation of thickness gives an idea about the growth mechanism of these films 7 8 . This .
