Khối lượng ngày càng tăng của dữ liệu trong các tổ chức và tính không đồng nhất của nó nâng cao thách thức đối với sự linh hoạt của giải thích cụ phân tích dữ liệu, và cá nhân trình bày kết quả. Sử dụng Kinh doanh thông minh ngữ nghĩa (SBI) kiến trúc cho phép tích hợp kinh doanh ngữ nghĩa, nguồn dữ liệu không đồng nhất và kiến thức kỹ thuật công cụ hỗ trợ ra quyết định thông minh | ADVANCED HOLOGRAPHY - METROLOGY AND IMAGING Edited by Izabela Naydenova Advanced Holography - Metrology and Imaging Edited by Izabela Naydenova Published by InTech Janeza Trdine 9 51000 Rijeka Croatia Copyright 2011 InTech All chapters are Open Access distributed under the Creative Commons Attribution license which permits to copy distribute transmit and adapt the work in any medium so long as the original work is properly cited. After this work has been published by InTech authors have the right to republish it in whole or part in any publication of which they are the author and to make other personal use of the work. Any republication referencing or personal use of the work must explicitly identify the original source. As for readers this license allows users to download copy and build upon published chapters even for commercial purposes as long as the author and publisher are properly credited which ensures maximum dissemination and a wider impact of our publications. Notice Statements and opinions expressed in the chapters are these of the individual contributors and not necessarily those of the editors or publisher. No responsibility is accepted for the accuracy of information contained in the published chapters. The publisher assumes no responsibility for any damage or injury to persons or property arising out of the use of any materials instructions methods or ideas contained in the book. Publishing Process Manager Silvia Vlase Technical Editor Teodora Smiljanic Cover Designer Jan Hyrat Image Copyright idea for life 2011. Used under license from First published October 2011 Printed in Croatia A free online edition of this book is available at Additional hard copies can be obtained from orders@ Advanced Holography - Metrology and Imaging Edited by Izabela Naydenova p. cm. ISBN 978-953-307-729-1 ikrrr iJ OPEN ACCESS INI Cvn PUBLISHER INTECH open free online editions of InTech Books and Journals
