Transmission electron microscopy (TEM) is a technique where the electron-beam is transmitted through an ultra-thin specimen, interacting with specimen as it passes through it. An image is formed from the interaction of the electrons transmitted through the specimen, which is then magnified and focused onto an imaging device, such as a fluorescent screen, a photographic film, or a charge-coupled device (CCD) sensor. This technique is capable of imaging at significantly high resolution than the light microscopes, owing to the small de-Broglie wavelength of electrons
