It is a pleasure and an honor to comment on this outstanding book, Spectroscopic Ellipsometry: Principles and Applications by Dr H. Fujiwara. It is a tutorial introduction, yet offers considerable depth into advanced topics such as generalized ellipsometry and advanced dispersion and oscillator models for analysis of complex materials systems. Each chapter is extremely well referenced, with over 400 literature citations in total, providing the reader rapid access to considerable published literature from fundamentals to recent advances. It is also well illustrated, with over 200 figures, making this an excellent possible textbook for teaching ellipsometry at both the beginning and intermediate to advanced levels. The book will be appropriate.
