Optical properties of Sb doped Ge films deposited on silicon substrate by molecular beam epitaxy

The active electron concentration was obtained as large as . The tensile strain level in the Sb-doped Ge epilayers was twice larger than that of the P-doped Ge films using GaP solid source or PH3 gas precursor. The results have a significant suggestion in the realization of Si-based photoelectronic devices that could be compatible to the main stream CMOS technology. | VNU Journal of Science: Mathematics – Physics, Vol. 34, No. 3 (2018) 48-54 Optical Properties of Sb Doped Ge Films Deposited on Silicon Substrate by Molecular Beam Epitaxy Luong Thi Kim Phuong1,* Le Thanh Vinh2, Abdelhamid Ghrib3, Moustafa El Kurdi3, Philippe Boucaud3, Nguyen Thi Quynh Nga4 1 Hong Duc University, 565 Quang Trung Street, Dong Ve District, Thanh Hoa City, Viet Nam Aix- Marseille University, CNRS CINaM- UMR 7325, F-13288 Marseille Cedex 09, France 3 Institut d'Electronique Fondamentale, CNRS UMR 8622, Université Paris-Sud, Bât. 220, F-91405 Orsay, France 4 Dao Duy Tu High School Thanh hoa City, Viet Nam 2 Received 08 March 2018 Revised 06 September 2018; Accepted 08 September 2018 Abstract: To enhance the photoluminescence efficiency of the Ge films, we can apply a tensile strain or introduce an electron doping in the Ge epi-layers for engineering the energy band gap of the Ge bulk. In this work, we combined both the electron doping method from a Sb source and a tensile strain via two-step growth in the Ge films. Sb-doped Ge films were grown on Si(001) substrate by molecular beam epitaxy technique. The dependence of the photoluminescence intensity on the substrate temperature in the range of 130-240oC and on the Sb source temperature from 240 to 300oC were investigated. The active electron concentration was obtained as large as . The tensile strain level in the Sb-doped Ge epilayers was twice larger than that of the P-doped Ge films using GaP solid source or PH3 gas precursor. The results have a significant suggestion in the realization of Si-based photoelectronic devices that could be compatible to the main stream CMOS technology. Keywords: n-doped Ge; Sb source; photoluminescence; tensile strain; optoelectronic. 1. Introduction Photonics and optoelectronics play an important role in many fields of communication and information technology. In recent years, research on tensile strain Ge/Si with high electron doping has been .

Không thể tạo bản xem trước, hãy bấm tải xuống
TÀI LIỆU MỚI ĐĂNG
Đã phát hiện trình chặn quảng cáo AdBlock
Trang web này phụ thuộc vào doanh thu từ số lần hiển thị quảng cáo để tồn tại. Vui lòng tắt trình chặn quảng cáo của bạn hoặc tạm dừng tính năng chặn quảng cáo cho trang web này.