The flight SEU rate is compared and analyzed with the prediction. The result indicates that the SEU prediction method can give appropriately support to electronic parts on-orbit application and the IDT 7026 can be used in spacecraft with some mitigation methods. | Journal of Automation and Control Engineering Vol. 4, No. 5, October 2016 SRAM IDT7026 SEU Prediction and On-Orbit Validation Jingjing Li, Sipei Shao, Xiaoyun Hao, Yong Liu, and Yutu Zhang Shandong Aerospace Electro-Technology Institute, Yantai, China Email: {hitsat509, ssp51689, hxy_2018, yongliu513}@, yutuzh@ Liner Energy Transfer (LET) relationship is then computed. The SEU rate can be finally predicted. On-orbit experiment is an effective method to evaluate SEU prediction precision [5], [6]. SEU prediction error revise can be performed using the on-orbit experiment data thus to improve the SEU prediction precision. In this paper, the SEU prediction and on-orbit experiment for the SRAM IDT7026 is presented. Firstly, the ground SEU experiment is performed and the SEU rate is predicted using space radiation model. Then the electronic circuit is designed and on-orbit experimented, and the flight SEU rate is obtained. Finally, the SEU prediction is compared with the on-orbit experiment, and the prediction error is analyzed. Abstract—Single Event Effect (SEE) prediction and validation is important for low cost electronic parts on-orbit application. As the SRAM IDT7026 has no space radiationresistant measures, there are SEE risks when it is applied in aerospace activities. In order to assess the IDT7026 SEE performance, the SEE prediction and flight validation are performed. The on-orbit Single Event Upset rate for the SRAM IDT7026 is predicted using LET cross-section function fitted from ground SEU experiment data. To validate the prediction result, the flight experiment is carried out for IDT7026 and the on-orbit SEU data is obtained. The flight SEU rate is compared and analyzed with the prediction. The result indicates that the SEU prediction method can give appropriately support to electronic parts on-orbit application and the IDT 7026 can be used in spacecraft with some mitigation methods. II. Index Terms—single event upset prediction, LET .
