Large amount of wheat grains wasted during preservation. This paper deals with an high voltage electric field (HVEF) preservation method for wheat grain. The HV upto 50 kV is given in pulses between two electrodes and wheat grain is kept in between them to increase its shelf life. The wheat is spoiled during storage, fungi crop during harvesting, transport, and handling operations. The temperature and moisture content during storage are major factors to spoil it and germinate insects and fungal growth. This HVEF remove the moisture content and avoid fungal growth.
