The automotive memory devices especially work in high-temperature because they are located close to engine, exhaust units; those require high reliable operation and long-life data retention in high-temperature environments. This paper reports on the investigation of memory data retention of a nano-organic material-based nonvolatile memory in high-temperature environments. The decay of memory state current was theoretically presented as a stretched-exponential law. By fitting the measured currents to the stretched-exponential equation at different temperatures, the activation energy of decay and acceleration factor was deduced, which allows to predict the device performance at high-temperature environment like in a car. The method presented in study can be applied to estimate the memory data retention at high-temperature for other car memories. | A study on memory data retention in high-temperature environments for automotive
