The experiment was conducted to examine the nature of association among seed yield, its component traits and spot blotch resistance traits in F2 population of the cross Bijaga yellow x NIDW-295. Simple correlation analysis revealed that the significant positive correlation of spot blotch resistance traits such as disease severity (%) and AUDPC showed that highly significant and negative association with number of tillers per plant, spike length, number of spikelets per spike, number of grain per spike, thousand grain weight and seed yield per plant implies that indirect selection for these traits helps in development of spot blotch resistant genotypes. | Nội dung Text Studies on correlation and path analysis for spot blotch disease resistance and yield parameters in F2 segregating population of durum wheat Triticum durum L.
