The as-deposited thin films were characterized by powdered X-ray diffraction and field emission scanning electron microscopy. Thin films of CdS deposited at low temperature (350◦C) consist of densely packed granular crystallites with an average size of ca. 150 nm, while at higher temperatures (400 and 450◦C) particles with varying sizes and mixed morphologies are observed. The ZnS thin films deposited at 400◦C showed rod-like structures, whereas dense globular-like structures were obtained at 450◦C. Energy dispersive X-ray analysis was performed to study the chemical composition of the thin films. |
