In the study "Comparison of determining the 10B and 6Li depth profiles based on NDP and SIMS analytical methods" the comparison of the analytical results between SIMS (Secondary-ion mass spectrometry) and NDP (Neutron Depth Profiling) methods have been carried out with LiCoO2 and BSi samples. The NDP is an analytical method to analyze the component nuclide concentration versus depth distribution in a sample by detecting the charged particles emitted after the neutrons are absorbed. |
