Tham khảo tài liệu 'recent advances in mechatronics - ryszard jabonski et al (eds) episode 2 part 4', kỹ thuật - công nghệ, cơ khí - chế tạo máy phục vụ nhu cầu học tập, nghiên cứu và làm việc hiệu quả | 504 M. Tabe R. Nuryadi Z. A. Burhanudin D. Moraru K. Yokoi H. Ikeda Fig. 5 Random-telegraph-signal observed for the dark and light-illuminated conditions. The frequency of the RTS increases with decreasing wavelength. This current switching in RTS is ascribed to individual photon absorption. In order to improve the quantum efficiency we have tried to detect photons absorbed in the underlying Si substrate by changing the substrate structure from n -Si to p on p layered one. As a preliminary result we succeeded in detecting individual boron ions by monitoring the single-hole-tunneling current 9 . References 1 D. V. Averin and K. K. Likharev Single charge tunneling edited by H. Grabert and M Devoret Plenum New York 1992 . 2 L. J. Geerligs V. F. Anderegg P. A. M. Holweg J. E. Mooij H. Pothier D. Esteve C. Urbina and M. H. Devoret Phys. Rev. Lett. 64 2691 1990 . 3 H. Pothier P. Lafarge C. Urbina D. Esteve and M. H. Devoret Europhys. Lett. 17 249 1992 . 4 H. Ikeda and M. Tabe . Phys. 99 073705 2006 . 5 and unpublished. 6 and IEEE Trans. Nanotech-nol. 2 231 2003 . 7 R. Nuryadi H. Ikeda Y. Ishikawa and M. Tabe Appl. Phys. Lett. 86 133106 2005 . 8 R. Nuryadi Y. Ishikawa and M. Tabe Phys. Rev. B 73 045310 2005 . 9 Z. A. Burhanudin and M. Tabe unpublished. Calibration of normal force in atomic force microscope M. Ekwinska G. Ekwinski Z. Rymuza Warsaw University of Technology Institute of Micromechanics and Photonics Sw. A. Boboli 8 Warsaw 02-525 Poland. Abstract Investigation with the use of the atomic force microscope enables to estimate material properties in micro nanometer scale. During such investigation load applied by the sensor in this case cantilever on the investigated surface is a crucial parameter. Under that circumstances there were elaborated several methods of normal force calibration. In this work a new calibration method with calibration gratings is proposed as well as .
