. For further volumes: Tomi Laurila Vesa Vuorinen Toni T. Mattila Markus Turunen Mervi Paulasto-Kröckel Jorma K. Kivilahti • • • Interfacial Compatibility in Microelectronics Moving Away from the Trial and Error Approach 123 .Tomi Laurila School of Electrical Engineering Aalto University Otakaari 7B 02150 Espoo Finland Vesa Vuorinen School of Electrical Engineering Aalto University Otakaari 7B 02150 Espoo Finland Toni T. Mattila School of Electrical Engineering Aalto University Otakaari 7B 02150 Espoo Finland Markus Turunen School of Electrical Engineering Aalto University Otakaari 7B 02150 Espoo Finland Mervi Paulasto-Kröckel School of Electrical Engineering Aalto University Otakaari 7B 02150 Espoo Finland Jorma K. Kivilahti School of Electrical Engineering.
