Part 2 book "Electrical atomic force microscopy for nanoelectronics" includes content: Characterizing ferroelectricity with an atomic force microscopy - An all around technique; electrical AFM for the analysis of resistive switching; magnetic force microscopy for magnetic recording and devices; space charge at nanoscale - probing injection and dynamic phenomena under dark light configurations by using kpfm and C AFM, conductive AFM of 2D materials and heterostructures for nanoelectronics; diamond probes technology, . and other contents. |
